Testing
|
No. |
Equipment |
Person in Charge |
Telephone Extention |
|
1 |
Transmission Electron Microscopy (TEM) |
Yan-Ru Lin |
4673 4672 |
|
2 |
Field Emission Scanning Electron Microscope(FE-SEM) |
Jyh-Wei Lee |
4437 |
|
3 |
X-Ray Diffractometer (XRD) |
Pi-Chun Juan |
4672 |
|
4 |
Scanning Electron Microscope(SEM) |
Jyh-Shiarn Cherng |
4671 |
|
5 |
Nano-indenter |
Jyh-Wei Lee |
4437 |
|
6 |
IV-CVmeasurement system |
Pi-Chun Juan |
4680 |
|
7 |
Atomic Force Microscopc(AFM) |
Li-Chun Chang |
4401 |
|
8 |
Ellipsometer |
Yang-Yan Yu |
4676 |
|
9 |
Sputtering system (6 sets) |
Jang-Hsing Hsieh Sheng-Chi Chen Jyh-Shiarn Cherng Pi-Chun Juan Jong-Hong Lu Yan-Ru Lin |
4677 4679 4671 4680 4678 4673 |
|
10 |
Solar simulator |
Jang-Hsing Hsieh |
4677 |
|
11 |
Photon-to-electron Conversion Efficiency (IPCE) |
Jang-Hsing Hsieh
|
4677 |
|
12 |
Fluorescence Spectrometer |
Yang-Yan Yu |
4676 |
|
13 |
Surface profiler |
Jang-Hsing Hsieh |
4677 |
|
14 |
Electrochemical system (2 sets) |
Fu-Yung Hsu Kun-Cheng Peng |
4672 4674 |
|
15 |
Material processing simulation |
Hsuan-Chung Wu |
4675 |