1

Field Emission Scanning Electron Microscope

Chuan-Ming Tseng、Jyh-Wei Lee

4402、4437

2

EDS

Chuan-Ming Tseng、Jyh-Wei Lee

4402、4437

3

Alpha-Step

Jang-Hsing Hsieh

4677

4

Fourier-transform infrared spectroscopy(FTIR)

Yu-Ching Huang

4477

5

UV/VIS/NIR spectrometers

Yang-Yan Yu

4676

6

X-ray Photoelectron Spectrometer(XPS)

Wei-Yi Jin

4390

7

Transmission Electron Microscopy(HRTEM)

Yan-Ru Lin

4673、4672

8

Field Emission Scanning Electron Microscope(FE-SEM)

Jyh-Wei Lee

4437

9

X-Ray Diffractometer(XRD)

Pi-Chun Juan

4680

10

Scanning Electron Microscope(SEM)

Jyh-Shiarn Cherng

4671

11

Nano-indenter *1

Jyh-Wei Lee

4437

12

IV-CVmeasurement system

Pi-Chun Juan

4680

13

Atomic Force Microscopc(AFM)

Li-Chun Chang

4401

14

Ellipsometer

Yang-Yan Yu

4676

15

Sputtering system(6 sets)

Jang-Hsing Hsieh、Sheng-Chi Chen、Jyh-Shiarn Cherng、Pi-Chun Juan、Jong-Hong Lu、Yan-Ru Lin、

4677、4679、4671、4680、4678、4673

16

Solar simulator

Jang-Hsing Hsieh

4677

17

Photon-to-electron Conversion Efficiency (IPCE)

Jang-Hsing Hsieh

4677

18

Fluorescence Spectrometer

Yang-Yan Yu

4676

19

Surface profiler

Jang-Hsing Hsieh

4677

20

Electrochemical system(2 sets)

Kun-Cheng Peng

4674

21

Material processing simulation*1

Hsuan-Chung Wu

4675