| 1 |
Field Emission Scanning Electron Microscope |
Chuan-Ming Tseng、Jyh-Wei Lee |
4402、4437 |
| 2 |
EDS |
Chuan-Ming Tseng、Jyh-Wei Lee |
4402、4437 |
| 3 |
Alpha-Step |
Jang-Hsing Hsieh |
4677 |
| 4 |
Fourier-transform infrared spectroscopy(FTIR) |
Yu-Ching Huang |
4477 |
| 5 |
UV/VIS/NIR spectrometers |
Yang-Yan Yu |
4676 |
| 6 |
X-ray Photoelectron Spectrometer(XPS) |
Wei-Yi Jin |
4390 |
| 7 |
Transmission Electron Microscopy(HRTEM) |
Yan-Ru Lin |
4673、4672 |
| 8 |
Field Emission Scanning Electron Microscope(FE-SEM) |
Jyh-Wei Lee |
4437 |
| 9 |
X-Ray Diffractometer(XRD) |
Pi-Chun Juan |
4680 |
| 10 |
Scanning Electron Microscope(SEM) |
Jyh-Shiarn Cherng |
4671 |
| 11 |
Nano-indenter *1 |
Jyh-Wei Lee |
4437 |
| 12 |
IV-CVmeasurement system |
Pi-Chun Juan |
4680 |
| 13 |
Atomic Force Microscopc(AFM) |
Li-Chun Chang |
4401 |
| 14 |
Ellipsometer |
Yang-Yan Yu |
4676 |
| 15 |
Sputtering system(6 sets) |
Jang-Hsing Hsieh、Sheng-Chi Chen、Jyh-Shiarn Cherng、Pi-Chun Juan、Jong-Hong Lu、Yan-Ru Lin、 |
4677、4679、4671、4680、4678、4673 |
| 16 |
Solar simulator |
Jang-Hsing Hsieh |
4677 |
| 17 |
Photon-to-electron Conversion Efficiency (IPCE) |
Jang-Hsing Hsieh |
4677 |
| 18 |
Fluorescence Spectrometer |
Yang-Yan Yu |
4676 |
| 19 |
Surface profiler |
Jang-Hsing Hsieh |
4677 |
| 20 |
Electrochemical system(2 sets) |
Kun-Cheng Peng |
4674 |
| 21 |
Material processing simulation*1 |
Hsuan-Chung Wu |
4675 |
