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Testing

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No. Equipment Person in Charge Telephone Extention
1 Field Emission Scanning Electron Microscope Chuan-Ming Tseng、Jyh-Wei Lee 4402、4437
2 EDS Chuan-Ming Tseng、Jyh-Wei Lee 4402、4437
3 Alpha-Step Jang-Hsing Hsieh 4677
4 Fourier-transform infrared spectroscopy(FTIR) Yu-Ching Huang 4477
5 UV/VIS/NIR spectrometers Yang-Yan Yu 4676
6 X-ray Photoelectron Spectrometer(XPS) Wei-Yi Jin 4390
7 Transmission Electron Microscopy(HRTEM) Yan-Ru Lin 4673、4672
8 Field Emission Scanning Electron Microscope(FE-SEM) Jyh-Wei Lee 4437
9 X-Ray Diffractometer(XRD) Pi-Chun Juan 4680
10 Scanning Electron Microscope(SEM) Jyh-Shiarn Cherng 4671
11 Nano-indenter *1 Jyh-Wei Lee 4437
12 IV-CVmeasurement system Pi-Chun Juan 4680
13 Atomic Force Microscopc(AFM) Li-Chun Chang 4401
14 Ellipsometer Yang-Yan Yu 4676
15 Sputtering system(6 sets) Jang-Hsing Hsieh、Sheng-Chi Chen、Jyh-Shiarn Cherng、Pi-Chun Juan、Jong-Hong Lu、Yan-Ru Lin、 4677、4679、4671、4680、4678、4673
16 Solar simulator Jang-Hsing Hsieh 4677
17 Photon-to-electron Conversion Efficiency (IPCE) Jang-Hsing Hsieh 4677
18 Fluorescence Spectrometer Yang-Yan Yu 4676
19 Surface profiler Jang-Hsing Hsieh 4677
20 Electrochemical system(2 sets) Kun-Cheng Peng 4674
21 Material processing simulation*1 Hsuan-Chung Wu 4675
SOURCE: Sources