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Testing

 

No.

Equipment

Person in Charge

Telephone Extention

1

Transmission Electron Microscopy

(TEM)

Yan-Ru Lin

Fu-Yung Hsu

4673

4672

2

Field Emission Scanning Electron Microscope(FE-SEM)

Jyh-Wei Lee

4437

3

X-Ray Diffractometer (XRD)

Fu-Yung Hsu

4672

4

Scanning Electron Microscope(SEM)

Jyh-Shiarn Cherng

4671

5

Nano-indenter

Jyh-Wei Lee

4437

6

IV-CVmeasurement system

Pi-Chun Juan

4680

7

Atomic Force Microscopc(AFM)

Li-Chun Chang

4401

8

Ellipsometer

Yang-Yan Yu

4676

 

 

9

 

 

Sputtering system

(6 sets)

Jang-Hsing Hsieh

Sheng-Chi Chen

Jyh-Shiarn Cherng

Pi-Chun Juan

Jong-Hong Lu

Yan-Ru Lin

4677

4679

4671

4680

4678

4673

10

Solar simulator

Jang-Hsing Hsieh

4677

11

Photon-to-electron Conversion Efficiency (IPCE)

Jang-Hsing Hsieh

 

4677

12

Fluorescence Spectrometer

Yang-Yan Yu

4676

13

Surface profiler

Jang-Hsing Hsieh

4677

14

Electrochemical system

(2 sets)

Fu-Yung Hsu

Kun-Cheng Peng

4672

4674

15

Material processing simulation

Hsuan-Chung Wu

4675

 

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